Electromagnetic Fault Injection (EMFI) is a powerful technique for inducing bit flips and instruction-level perturbations on microcontrollers, yet existing literature lacks a unified methodology for systematically mapping spatial sensitivity and classifying resulting fault behaviors. Building on insights from O'Flynn and Kuhnapfel et al., we introduce a platform-agnostic framework for Spatial EMFI Mapping and Fault Classification, aimed at understanding how spatial probe position influences fault outcomes. We present pilot experiments on three representative microcontroller targets including the Xtensa LX6 (ESP32) and two ChipWhisper boards not as definitive evaluations, but as illustrative demonstrations of how the proposed methodology can be applied in practice. These preliminary observations motivate a generalized and reproducible workflow that researchers can adopt when analyzing EMFI susceptibility across diverse embedded architectures.

翻译：电磁故障注入（EMFI）是一种在微控制器上诱导位翻转与指令级扰动的强效技术，然而现有文献缺乏用于系统化映射空间敏感性及分类故障行为的统一方法。基于O'Flynn与Kuhnapfel等人的研究洞见，我们提出了一种与平台无关的空间电磁故障注入映射与故障分类框架，旨在探究空间探头位置如何影响故障结果。我们在三个代表性微控制器目标（包括Xtensa LX6（ESP32）及两块ChipWhisper开发板）上进行了初步实验，这些实验并非作为最终评估，而是为了示例性展示所提方法在实际中的应用方式。这些初步观察推动了一个通用且可复现的工作流程，可供研究者在分析不同嵌入式架构的电磁故障注入敏感性时采用。