We investigate the influence of clock frequency on the success rate of a fault injection attack. In particular, we examine the success rate of voltage and electromagnetic fault attacks for varying clock frequencies. Using three different tests that cover different components of a System-on-Chip, we perform fault injection while its CPU operates at different clock frequencies. Our results show that the attack's success rate increases with an increase in clock frequency for both voltage and EM fault injection attacks. As the technology advances push the clock frequency further, these results can help assess the impact of fault injection attacks more accurately and develop appropriate countermeasures to address them.

翻译：本文研究了时钟频率对故障注入攻击成功率的影响。具体而言，我们考察了在不同时钟频率下电压故障攻击和电磁故障攻击的成功率。通过采用覆盖片上系统不同组件的三种测试方案，我们在其CPU以不同时钟频率运行时执行故障注入。实验结果表明，对于电压和电磁两种故障注入攻击，攻击成功率均随时钟频率升高而增加。随着技术进步不断推动时钟频率提升，这些结果有助于更准确地评估故障注入攻击的影响，并制定相应的应对措施。