Ptychographic imaging at synchrotron and X-ray free-electron laser sources requires densely overlapping scans, which limits throughput and increases dose; extending coherent diffractive imaging to overlap-free operation on extended samples remains an open problem. We present a self-supervised inverse-mapping network for single-frame Fresnel coherent diffraction imaging (CDI) and overlapped ptychography with fixed, pre-estimated probes. The learned neural network reconstructs individual object patches from either one diffraction frame or several overlapping measurements at a time. In single-frame mode, the phase diversity provided by the curved-wavefront probe at the off-focus sample position removes the requirement for overlap constraints, enabling sparser scans and proportionally lower dose at fixed exposure. On synthetic line patterns, reconstructed amplitude SSIM exceeds 0.90 in single-frame mode with the curved probe and reaches 0.952-0.968 with overlap constraints. Optimization of the network via a Poisson negative log likelihood objective, rather than the more common mean absolute error, yields 10-fold improved photon-dose efficiency at doses below $10^5$ photons per image, where shot noise typically limits resolution. In addition to these synthetic studies, we demonstrate robust single-frame reconstruction of extended samples using ptychographic datasets from APS and LCLS, with end-to-end reconstruction of a 10,304-frame workload approximately $36\times$ faster than a highly optimized iterative solver. Together, these results unify single-frame Fresnel CDI and overlapped ptychography within one self-supervised framework, supporting dose-efficient, high-throughput imaging at modern light sources.

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