Synthetic anomaly generation helps expand industrial anomaly datasets when real defects are scarce or unavailable. Existing approaches lie at two extremes: procedural approaches are fast but struggle to represent complex anomalies, while generative approaches produce diverse defects but require costly per-sample generation. We present FLASH, a framework that decouples defect generation from anomaly synthesis under a ``generate once, synthesize many'' paradigm. Given only normal images, FLASH uses Vision-Language Model (VLM) guidance and an image-generation model to produce a small set of defect images, from which it extracts, validates, and banks reusable defect patches. For synthesis of anomalous images, Object Boundary Suppression (OBS) first identifies the probable foreground object-aware region of the host image, while Multi-Resolution Spectral Pyramid (MRSP) noise generates diverse, size-controllable masks that determine the defect location and spatial extent. It then composes a large and diverse synthetic anomalous image set by localizing the defect region, sampling size-controllable placement masks and seamlessly blending retrieved defects onto new defect-free images without further need for image generation. Experiments on the MVTec AD 2 dataset show that FLASH-generated anomalies nearly close the calibration gap on real defects, reaching 78.1% image-level F1 against an 83.6% real-anomaly upper bound and providing the most consistent calibration transfer across detectors among procedural and generative alternatives. Moreover, FLASH synthesizes anomalies more than 11.95x faster than per-sample generative approaches.

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