Existing studies analyzing electromagnetic field (EMF) exposure in wireless networks have primarily considered downlink (DL) communications. In the uplink (UL), the EMF exposure caused by the user's smartphone is usually the only considered source of radiation, thereby ignoring contributions caused by other active neighboring devices. In addition, the network coverage and EMF exposure are typically analyzed independently for both the UL and DL, while a joint analysis would be necessary to fully understand the network performance. This paper aims at bridging the resulting gaps by presenting a comprehensive stochastic geometry framework including the above aspects. The proposed topology features base stations (BS) modeled via a homogeneous Poisson point process as well as a user process of type II (with users uniformly distributed in the Voronoi cell of each BS). In addition to the UL to DL exposure ratio, we derive joint probability metrics considering the UL and DL coverage and EMF exposure. These metrics are evaluated in two scenarios considering BS and/or user densifications. Our numerical results highlight the existence of optimal node densities maximizing these joint probabilities.

翻译：现有分析无线网络中电磁场暴露的研究主要考虑下行通信。在上行链路中，用户智能手机造成的电磁场暴露通常被视为唯一辐射源，从而忽略了其他活动邻近设备的贡献。此外，网络覆盖与电磁场暴露通常对上下行链路独立分析，而联合分析对于全面理解网络性能必不可少。本文旨在通过提出一个包含上述方面的综合随机几何框架来弥合这些差距。所提出的拓扑结构包含由均匀泊松点过程建模的基站以及第二类用户过程（用户均匀分布在每个基站的Voronoi胞元内）。除了上行与下行暴露比之外，我们还推导了考虑上下行覆盖与电磁场暴露的联合概率指标。这些指标在基站和/或用户密集化两种场景中进行了评估。数值结果凸显了存在最大化这些联合概率的最优节点密度。