Combinations of spectroscopic analysis and microscopic techniques are used across many disciplines of scientific research, including material science, chemistry and biology. X-ray spectromicroscopy, in particular, is a powerful tool used for studying chemical state distributions at the micro and nano scales. With the beam fixed, a specimen is typically rastered through the probe with continuous motion and a range of multimodal data is collected at fixed time intervals. The application of this technique is limited in some areas due to: long scanning times to collect the data, either because of the area/volume under study or the compositional properties of the specimen; and material degradation due to the dose absorbed during the measurement. In this work, we propose a novel approach for reducing the dose and scanning times by undersampling the raster data. This is achieved by skipping rows within scans and reconstructing the x-ray spectromicroscopic measurements using low-rank matrix completion. The new method is robust and allows for x 5-6 reduction in sampling. Experimental results obtained on real data are illustrated.

翻译：光谱分析与显微技术的结合被广泛应用于材料科学、化学及生物学等多个科研领域。其中，X射线光谱显微成像尤为突出，是研究微纳米尺度化学态分布的有力工具。在测量过程中，样品通常保持固定，而通过连续移动的光栅扫描探针，以固定时间间隔采集多种模态数据。但该技术的应用在以下方面存在局限：因研究区域大小/体积或样品成分特性导致的数据采集扫描时间过长；以及测量过程中辐射剂量造成的材料损伤。本研究提出一种通过欠采样光栅数据来降低辐射剂量与扫描时间的新方法。该方法通过跳过扫描行，并利用低秩矩阵补全技术重建X射线光谱显微测量数据来实现。新型方法具有鲁棒性，可实现采样量减少5-6倍的效果。文中展示了基于真实数据获得的实验结果。