This article present a new method to reconstruct slowly varying width defects in 2D waveguides using one-side section measurements at locally resonant frequencies. At these frequencies, locally resonant modes propagate in the waveguide up to a "cut-off" position. In this particular point, the local width of the waveguide can be recovered. Given multi-frequency measurements taken on a section of the waveguide, we perform an efficient layer stripping approach to recover shape variations slice by slice. It provides an L infinite-stable method to reconstruct the width of a slowly monotonous varying waveguide. We validate this method on numerical data and discuss its limits.

翻译：本条提出一种新的方法,用局部共振频率单部分测量法,重建2D波导体中缓慢变化的宽度缺陷。在这些频率上,局部共振模式在波导体中传播到“断点”位置。在此特定点上,波导体的局部宽度可以恢复。在对波导的某一部分进行多频度测量后,我们采用高效的层剥离方法,用切片来恢复形状变形切片。它提供了一个无穷的可测量法,以重建缓慢的单调波导体的宽度。我们在数字数据上验证这一方法,并讨论其限度。