Let $k_{1,\varepsilon}(n)$ be the smallest number of real linear measurements needed by a randomized oblivious sketch that estimates the nuclear norm of every fixed real $n\times n$ matrix within a factor $1\pm\varepsilon$, with probability at least $2/3$. For every fixed $0<\varepsilon<1$, we prove \[ \frac{n^2}{(\log n)^{A_\varepsilon}} \le k_{1,\varepsilon}(n) \le C_\varepsilon \frac{n^2\{\log\log(e^e n)\}^2}{\log(e n)}. \] Previously, the best unrestricted bounds for general linear sketches of the Schatten--1 norm were $Ω(n)$ and the trivial $O(n^2)$ upper bound (Li, Nguyen, Woodruff'19), leaving a polynomial gap. Our bounds close that gap up to polylogarithmic factors and give a nontrivial logarithmic saving below the $n^2$-measurement storage bound. The result extends much further. Write $k_{p,\varepsilon}(n)$ for the analogous sketch dimension for the Schatten--$p$ norm. For every fixed finite $p>0$ that is not a positive even integer, there are positive constants $A_{p,\varepsilon},C_{p,\varepsilon},c_p$ such that \[ \frac{n^2}{(\log n)^{A_{p,\varepsilon}}} \le k_{p,\varepsilon}(n) \le C_{p,\varepsilon}\frac{n^2}{(\log n)^{c_p}}, \] so $k_{p,\varepsilon}(n)=n^{2-o(1)}$ throughout the non-even regime. Together with the known tight bounds $Θ_{p,\varepsilon}(n^{2-4/p})$ for positive even $p$ and $Θ_\varepsilon(n^2)$ for $p=\infty$ (Li, Woodruff'16), our results close the remaining polynomial gap across the Schatten family and complete, up to polylogarithmic factors, the polynomial-order classification of general linear sketches for all Schatten-$p$ norms.

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