Physical side-channel attacks represent a great challenge for today's chip design. Although attacks on CMOS dynamic power represent a class of state-of-the-art attacks, many other effects potentially affect the security of CMOS chips analogously by affecting mostly static behaviour of the chip, including aging, ionizing radiation, or non-ionizing illumination of the CMOS. Vulnerabilities exploiting data dependency in CMOS static power were already demonstrated in practice and the analogous vulnerability exploiting light-modulated static power was demonstrated by simulation. This work confirms the CMOS vulnerability related to the light-modulated data-dependent static power experimentally and discusses future work.

翻译：物理侧信道攻击对当今芯片设计构成了重大挑战。尽管针对CMOS动态功耗的攻击代表了一类最先进的攻击技术，但许多其他效应同样可能影响CMOS芯片的安全性——这些效应主要影响芯片的静态行为，包括老化、电离辐射或CMOS的非电离光照射。利用CMOS静态功耗中数据依赖性的漏洞已在实践中得到验证，而利用光调制静态功耗的类似漏洞也通过仿真得以证实。本研究通过实验验证了与光调制数据依赖性静态功耗相关的CMOS漏洞，并对未来工作进行了讨论。