Due to their incentivizing features, memristors are a promising candidate for replacing CMOS-based memories, which are faced with various functional challenges in deep submicron process technologies. Memristors are nonvolatile, have low leakage, and are dense in comparison to CMOS-based memories like SRAM. In this regard, resistive RAM (ReRAM) and spin-transfer-torque RAM (STT-RAM) memristors are distinguished among other memristor-based memory technologies, due to their superiority in process maturity and metrics such as memory operation energy, memory latency, and area. Hence, this chapter focuses on these two memristor-based memory technologies. Despite the good features of these types of memory, they suffer from some reliability threats. Reliability parameters affect each other, and examining their positive and negative effects has a significant impact on the effectiveness of the proposed solutions. In one view, the threats can be categorized into two classes: (1) read/write error and (2) soft error. In this chapter, we comprehensively describe these threats and present the state-of-the-art solutions that enable the widespread use of memristors, particularly ReRAM and STT-RAM, in different applications. Finally, we introduce the emerging ability of memristors as a computing unit aiming to minimize data restoration in computing, and we show how to perform logic and arithmetic computation in a crossbar array.

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