Due to the crossbar array architecture, the sneak-path problem severely degrades the data integrity in the resistive random access memory (ReRAM). In this letter, we investigate the channel quantizer design for ReRAM arrays with multiple reads, which is a typical technique to improve the data recovery performance of data storage systems. Starting with a quantized channel model of ReRAM with multiple reads, we first derive a general approach for designing the channel quantizer, for both single-bit and multiple-bit quantization. We then focus on the single-bit quantization, which is highly suitable for practical applications of ReRAM. In particular, we propose a semi-analytical approach to design the multiple-read single-bit quantizer with less complexity. We also derive the theoretical bit-error probability of the optimal single-bit detector/quantization as the benchmark. Results indicate that the multiple-read operation is effective in improving the error rate performance of ReRAM. Moreover, our proposed multiple-read detector outperforms the prior art detector and achieves the performance of the optimal detector.

翻译：由于交叉阵列架构，潜行路径问题严重降低了阻变随机存取存储器（ReRAM）的数据完整性。本文研究了具有多读操作的ReRAM阵列的信道量化器设计，这是提升数据存储系统数据恢复性能的典型技术。从具有多读操作的ReRAM量化信道模型出发，我们首先推导了设计信道量化器的一般方法，适用于单比特和多比特量化。随后，我们聚焦于单比特量化，该方案非常适用于ReRAM的实际应用。具体而言，我们提出了一种半解析方法来设计复杂度更低的多读单比特量化器。我们还推导了最优单比特检测器/量化器的理论误比特概率作为性能基准。结果表明，多读操作能有效改善ReRAM的误码率性能。此外，我们提出的多读检测器优于现有检测器，并达到了最优检测器的性能水平。