Clock gating, the standard technique for cutting dynamic power, is introduced either as hand-written behavioral clock gates at the register-transfer level (RTL) or as integrated clock-gating (ICG) cells inserted automatically during synthesis; the two are widely treated as interchangeable. In this paper we show, on a real open-source 16-bit microcontroller core (openMSP430) synthesized with a 32 nm standard-cell library, that they are not equivalent in practice: behavioral latch-based RTL gating is functionally correct in ideal RTL simulation (10/10 self-checking testcases, identical to the ungated baseline) yet fails at gate level: the gated multiplier result is never captured and reads zero, while tool-inserted ICG cells pass gate-level simulation cleanly (10/10). We root-cause the failure to a hold race introduced by the late latch+AND gated clock, and show it persists across eight simulation configurations including full Standard Delay Format (SDF) back-annotation, not a simulator-setting artifact. We then quantify the power/area/timing (PPA) impact of three gating strengths: RTL behavioral (Opt1), synthesis ICG (Opt2), and both (Opt3), against the ungated baseline, across four workloads and three process corners (ss/tt/ff). The benefit is corner-robust: ICG (Opt2) cuts dynamic power by 74-81% and total power by 25-30% at every corner. We also show that in this leakage-dominated 32 nm regime the total-power win comes from the area/leakage reduction that gating brings (leakage -24 to -30%), not from the large dynamic saving, which instead dominates active-mode energy. Our recommendation for low-power design on open-source cores is to prefer tool-inserted ICG cells over hand-written behavioral clock gates. The full flow (Design Compiler synthesis, PrimeTime PX power, and self-checking verification) is released as an open artifact.

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