A one-shot device is a unit that operates only once, after which it is either destroyed or needs to be rebuilt. For this type of device, the operational status can only be assessed at a specific inspection time, determining whether failure occurred before or after it. Consequently, lifetimes are subject to left- or right-censoring. One-shot devices are usually highly reliables. To analyze the reliability of such products, an accelerated life test (ALT) plan is typically employed by subjecting the devices to increased levels of stress factors, thus allowing life characteristics observed under high-stress conditions to be extrapolated to normal operating conditions. By accelerating the degradation process, ALT significantly reduces both the time required for testing and the associated experimental costs. Recently, robust inferential methods have gained considerable interest in statistical analysis. Among them, weighted minimum density power divergence estimators (WMDPDEs) are widely recognized for their robust statistical properties with small loss of efficiency. In this work, robust WMDPDE and associated statistical tests are developed under a log-logistic lifetime distribution with multiple stresses. Explicit expressions for the estimating equations and asymptotic distribution of the estimators are obtained. Further, a Monte Carlo simulation study is presented to evaluate the performance of the WMDPDE in practical applications.

翻译：一次性设备是指仅能运行一次，之后要么被销毁，要么需要重建的单元。对于此类设备，其运行状态只能在特定的检测时间点进行评估，以确定故障发生在该时间点之前还是之后。因此，其寿命数据会受到左截尾或右截尾的影响。一次性设备通常具有很高的可靠性。为分析此类产品的可靠性，通常采用加速寿命试验（ALT）方案，使设备承受更高水平的应力因子，从而可以将高应力条件下观测到的寿命特征外推至正常操作条件。通过加速退化过程，ALT显著减少了所需的测试时间及相关实验成本。近年来，稳健推断方法在统计分析中引起了广泛关注。其中，加权最小密度功率散度估计量（WMDPDEs）因其在效率损失较小的情况下具有稳健的统计特性而广受认可。本研究在具有多重应力的对数逻辑寿命分布下，开发了稳健的WMDPDE及相关统计检验方法。我们推导了估计方程的显式表达式以及估计量的渐近分布。此外，还通过蒙特卡洛模拟研究评估了WMDPDE在实际应用中的性能。