A new probability distribution to study lifetime data in reliability is introduced in this paper. This one is a first approach to a non-homogeneous phase-type distribution. It is built by considering one cut-point in the non-negative semi-line of a phase-type distribution. The density function is defined and the main measures associated, such as the reliability function, hazard rate, cumulative hazard rate and the characteristic function are also worked out. This new class of distributions enables to decrease the number of parameter in the estimate when inference is considered. Besides, the likelihood distribution is built to estimate the model parameters by maximum likelihood. Several applications by considering Resistive Random Access Memories compare the adjustment when phase type distributions and one cut-point phase-type distributions are considered. The developed methodology has been computationally implemented in R-cran.

翻译：本文引入了一种用于可靠性寿命数据分析的新概率分布。这是对非齐次相位型分布的首次尝试，通过在相位型分布的非负半直线上设置一个截断点构建而成。文中定义了其密度函数，并推导了相关主要度量指标，包括可靠性函数、失效率、累积失效率及特征函数。该新型分布类能在推断过程中减少待估参数数量。此外，通过构建似然分布函数，采用极大似然法对模型参数进行估计。以阻变随机存取存储器为对象的多组应用实验，对比了相位型分布与单截断点相位型分布的拟合效果。所提方法已在R-cran平台上完成计算实现。