Hybrid event-frame sensors integrate an Event Vision Sensor (EVS) and an Active Pixel Sensor (APS) within a single chip, combining the high dynamic range and low latency of the EVS with the rich spatial intensity information from the APS. While this tight integration offers compact and temporally precise imaging, the complex circuit architecture introduces nontrivial noise patterns that remain poorly understood and unmodeled. In this work, we present the first unified statistics-based imaging noise model that jointly describes the noise behavior of APS and EVS pixels. Our formulation explicitly incorporates photon shot noise, dark current noise, fixed-pattern noise, and quantization noise, and links EVS noise to illumination level and dark current. Based on this formulation, we further develop a calibration pipeline to estimate noise parameters from real data and provide a detailed analysis of both APS and EVS noise behaviors. Finally, we propose H-ESIM, a statistically grounded simulator that generates RAW frames and events under realistic jointly calibrated noise statistics. Experiments on two hybrid sensors validate our model across multiple imaging tasks, including video frame interpolation and deblurring, demonstrating strong transfer from simulation to real data.

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