We present a fault-tolerant by-design RISC-V SoC and experimentally assess it under atmospheric neutrons and 200 MeV protons. The dedicated ECC and Triple-Core Lockstep countermeasures correct most errors, guaranteeing a device cross-section lower than $5.36 \times 10^{-12}$ cm$^2$.

翻译：本文提出一种基于设计即容错理念的RISC-V片上系统，并通过大气中子和200 MeV质子辐照实验进行评估。专用纠错码与三核锁步容错机制能够修正绝大多数错误，确保器件截面低于$5.36 \times 10^{-12}$ cm$^2$。