An SRAM Physical Unclonable Function (PUF) can distinguish SRAM modules by analyzing the inherent randomness of their start-up behavior. However, the effectiveness of this technique varies depending on the design and fabrication of the SRAM module. This study compares two similar microcontrollers, both equipped with on-chip SRAM, to determine which device produces a better SRAM PUF. Both microcontrollers are programmed with an identical SRAM PUF authentication routine and tested under varying ambient temperatures (ranging from 10 °C to 50 °C) to evaluate the impact of temperature on SRAM PUF performance. One embedded SRAM works significantly better than the other, even though the two models are closely related. The presented results can be used early in the design process to compare arbitrary on-chip SRAM models and see which is best suited for implementing an SRAM PUF.

翻译：SRAM物理不可克隆函数（PUF）可通过分析SRAM模块启动行为的固有随机性来区分不同模块。然而，该技术的有效性因SRAM模块的设计与制造工艺而异。本研究比较了两款均配备片上SRAM的相似微控制器，以确定哪种器件能产生更优的SRAM PUF。两款微控制器均加载相同的SRAM PUF认证程序，并在变化的环境温度（10°C至50°C）下进行测试，以评估温度对SRAM PUF性能的影响。尽管两款型号密切相关，但其中一款的嵌入式SRAM表现显著优于另一款。本研究呈现的结果可在设计流程早期用于比较任意片上SRAM型号，从而确定哪种型号最适合实现SRAM PUF。